https://scholars.lib.ntu.edu.tw/handle/123456789/324145
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Guo, Ruey-Shan | en_US |
dc.contributor.author | Tsai, Cheng-Kai | en_US |
dc.contributor.author | Lee, Jian-Huei | en_US |
dc.contributor.author | SHI-CHUNG CHANG | en_US |
dc.date.accessioned | 2018-09-10T05:58:46Z | - |
dc.date.available | 2018-09-10T05:58:46Z | - |
dc.date.issued | 1996 | - |
dc.identifier.uri | http://www.scopus.com/inward/record.url?eid=2-s2.0-0030385243&partnerID=MN8TOARS | - |
dc.identifier.uri | http://scholars.lib.ntu.edu.tw/handle/123456789/324145 | - |
dc.language | en | en |
dc.relation.ispartof | IEEE/CPMT International Electronic Manufacturing Technology (IEMT) Symposium | en_US |
dc.source | AH-Scopus to ORCID | - |
dc.title | Intelligent process diagnosis based on end-of-line electrical test data | - |
dc.type | conference paper | en |
dc.relation.pages | 347-354 | - |
item.openairetype | conference paper | - |
item.openairecristype | http://purl.org/coar/resource_type/c_5794 | - |
item.fulltext | no fulltext | - |
item.grantfulltext | none | - |
item.cerifentitytype | Publications | - |
crisitem.author.dept | Electrical Engineering | - |
crisitem.author.dept | Industrial Engineering | - |
crisitem.author.dept | Communication Engineering | - |
crisitem.author.orcid | 0000-0001-7595-2485 | - |
crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
crisitem.author.parentorg | College of Engineering | - |
crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
顯示於: | 電機工程學系 |
在 IR 系統中的文件,除了特別指名其著作權條款之外,均受到著作權保護,並且保留所有的權利。