https://scholars.lib.ntu.edu.tw/handle/123456789/359229
Title: | Modeling the Floating-Body-Effect-Induced Drain Current Behavior of 40nm PD SOI NMOS Device Via SPICE BJT/MOS Model Approach | Authors: | J. S. Su J. B. Kuo D. Chen C. S. Yeh JAMES-B KUO |
Issue Date: | Jan-2010 | Source: | EUROSOI | URI: | http://scholars.lib.ntu.edu.tw/handle/123456789/359229 |
Appears in Collections: | 電機工程學系 |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.