https://scholars.lib.ntu.edu.tw/handle/123456789/374350
Title: | Testing of TSV-induced Small Delay Faults for Three Dimensional Integrated Circuits, | Authors: | CHIEN-MO LI C.Y. Kuo C. J. Shih J. C. M. Li K. Chakrabarty CHIEN-MO LI |
Issue Date: | Jan-2012 | Source: | IEEE 3D IC Test workshop | URI: | http://scholars.lib.ntu.edu.tw/handle/123456789/374350 |
Appears in Collections: | 電子工程學研究所 |
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