https://scholars.lib.ntu.edu.tw/handle/123456789/388541
Title: | Effect of focued ion beam imaging process on the crystallinity of InAs | Authors: | T. H. Huang W. C. Chen K. C. Chen HAO-HSIUNG LIN |
Issue Date: | Nov-2014 | Start page/Pages: | 1178 | Source: | IEDMS 2014, international electron devices and materials symposium | URI: | http://scholars.lib.ntu.edu.tw/handle/123456789/388541 |
Appears in Collections: | 電機工程學系 |
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