https://scholars.lib.ntu.edu.tw/handle/123456789/429110
DC Field | Value | Language |
---|---|---|
dc.contributor.author | C.T.Lin | en_US |
dc.contributor.author | J.G.Hwu | en_US |
dc.contributor.author | JENN-GWO HWU | en_US |
dc.creator | JENN-GWO HWU;J.G.Hwu;C.T.Lin | - |
dc.date.accessioned | 2019-10-31T06:41:43Z | - |
dc.date.available | 2019-10-31T06:41:43Z | - |
dc.date.issued | 2018 | - |
dc.identifier.issn | 19386737 | - |
dc.identifier.uri | https://scholars.lib.ntu.edu.tw/handle/123456789/429110 | - |
dc.relation.ispartof | 233rd ECS Meeting | - |
dc.title | Improved C-V Hysteresis and Two-States Characteristics in MIS (p) Structure with Elongated Thin Metal Gate | en_US |
dc.type | conference paper | en |
dc.identifier.doi | 10.1149/08506.0051ecst | - |
dc.identifier.scopus | 2-s2.0-85050116799 | - |
dc.relation.pages | TU3-A4 | - |
dc.relation.journalvolume | 85 | - |
dc.relation.journalissue | 6 | - |
item.cerifentitytype | Publications | - |
item.openairetype | conference paper | - |
item.openairecristype | http://purl.org/coar/resource_type/c_5794 | - |
item.grantfulltext | none | - |
item.fulltext | no fulltext | - |
crisitem.author.dept | Electrical Engineering | - |
crisitem.author.dept | Electronics Engineering | - |
crisitem.author.orcid | 0000-0001-9688-0812 | - |
crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
Appears in Collections: | 電機工程學系 |
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