https://scholars.lib.ntu.edu.tw/handle/123456789/443309
Title: | Analysis of border and interfacial traps in ALD-Y<inf>2</inf>O<inf>3</inf> and -Al<inf>2</inf>O<inf>3</inf> on GaAs via electrical responses - A comparative study | Authors: | Chang, T.W. Lin, K.Y. Lin, Y.H. Young, L.B. Kwo, J. Hong, M. MINGHWEI HONG |
Issue Date: | 2017 | Journal Volume: | 178 | Start page/Pages: | 199-203 | Source: | Microelectronic Engineering | URI: | https://scholars.lib.ntu.edu.tw/handle/123456789/443309 | DOI: | 10.1016/j.mee.2017.05.019 |
Appears in Collections: | 物理學系 |
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