https://scholars.lib.ntu.edu.tw/handle/123456789/501026
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Chen, C.C. | en_US |
dc.contributor.author | Lin, O.G. | en_US |
dc.contributor.author | Kuo, J.B. | en_US |
dc.contributor.author | CHUNG-PING CHEN | en_US |
dc.date.accessioned | 2020-06-11T06:45:51Z | - |
dc.date.available | 2020-06-11T06:45:51Z | - |
dc.date.issued | 2007 | - |
dc.identifier.uri | https://scholars.lib.ntu.edu.tw/handle/123456789/501026 | - |
dc.relation.ispartof | ICSICT-2006: 2006 8th International Conference on Solid-State and Integrated Circuit Technology, Proceedings | - |
dc.title | Analysis of fringing-electric-field-related capacitance behavior of narrow-channel FD SOI NMOS devices using 3D simulation | en_US |
dc.type | conference paper | en |
dc.identifier.doi | 10.1109/ICSICT.2006.306188 | - |
dc.identifier.scopus | 2-s2.0-34547365925 | - |
dc.identifier.url | https://www.scopus.com/inward/record.uri?eid=2-s2.0-34547365925&doi=10.1109%2fICSICT.2006.306188&partnerID=40&md5=017a189ea622b418a80979d1b12728de | - |
dc.relation.pages | 1376-1379 | - |
item.cerifentitytype | Publications | - |
item.openairetype | conference paper | - |
item.fulltext | no fulltext | - |
item.grantfulltext | none | - |
item.openairecristype | http://purl.org/coar/resource_type/c_5794 | - |
crisitem.author.dept | Electronics Engineering | - |
crisitem.author.dept | Electrical Engineering | - |
crisitem.author.dept | Center for Artificial Intelligence and Advanced Robotics | - |
crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
crisitem.author.parentorg | Others: University-Level Research Centers | - |
顯示於: | 電機工程學系 |
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