https://scholars.lib.ntu.edu.tw/handle/123456789/501349
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Wu, S. | en_US |
dc.contributor.author | Wang, L.-T. | en_US |
dc.contributor.author | Jiang, Z. | en_US |
dc.contributor.author | Song, J. | en_US |
dc.contributor.author | Sheu, B. | en_US |
dc.contributor.author | Wen, X. | en_US |
dc.contributor.author | Hsiao, M.S. | en_US |
dc.contributor.author | Li, J.C.-M. | en_US |
dc.contributor.author | Huang, J.-L. | en_US |
dc.contributor.author | CHIEN-MO LI | en_US |
dc.contributor.author | JIUN-LANG HUANG | en_US |
dc.creator | Wu, S.;Wang, L.-T.;Jiang, Z.;Song, J.;Sheu, B.;Wen, X.;Hsiao, M.S.;Li, J.C.-M.;Huang, J.-L.;Apte, R. | - |
dc.date.accessioned | 2020-06-11T06:50:38Z | - |
dc.date.available | 2020-06-11T06:50:38Z | - |
dc.date.issued | 2008 | - |
dc.identifier.uri | https://scholars.lib.ntu.edu.tw/handle/123456789/501349 | - |
dc.relation.ispartof | Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems | - |
dc.title | On optimizing fault coverage, pattern count, and ATPG run time using a hybrid single-capture scheme for testing scan designs | en_US |
dc.type | conference paper | en |
dc.identifier.doi | 10.1109/DFT.2008.29 | - |
dc.identifier.scopus | 2-s2.0-67649976838 | - |
dc.identifier.url | https://www.scopus.com/inward/record.uri?eid=2-s2.0-67649976838&doi=10.1109%2fDFT.2008.29&partnerID=40&md5=b4482aed0883cf9f612e5b8804dc3462 | - |
dc.relation.pages | 143-151 | - |
item.cerifentitytype | Publications | - |
item.fulltext | no fulltext | - |
item.openairecristype | http://purl.org/coar/resource_type/c_5794 | - |
item.openairetype | conference paper | - |
item.grantfulltext | none | - |
crisitem.author.dept | Electrical Engineering | - |
crisitem.author.dept | Electronics Engineering | - |
crisitem.author.dept | MediaTek-NTU Research Center | - |
crisitem.author.dept | Electronics Engineering | - |
crisitem.author.dept | Electrical Engineering | - |
crisitem.author.dept | Program in Integrated Circuit Design and Automation | - |
crisitem.author.orcid | 0000-0002-4393-5186 | - |
crisitem.author.orcid | 0000-0002-9425-3855 | - |
crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
crisitem.author.parentorg | Others: University-Level Research Centers | - |
crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
crisitem.author.parentorg | Graduate School of Advanced Technology | - |
顯示於: | 電機工程學系 |
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