https://scholars.lib.ntu.edu.tw/handle/123456789/612014
標題: | Study using position silicon detectors for performance testing of computer numerically controlled machine tools | 作者: | Jywe W. Wen-Yuh Jywe |
關鍵字: | Computer control systems;Control equipment;Cutting;Error analysis;Machining;Numerical control systems;Semiconductor lasers;Silicon sensors;Computer numerically controlled (CNC) machine tools;Machine tools | 公開日期: | 2002 | 卷: | 216 | 期: | 5 | 起(迄)頁: | 725-733 | 來源出版物: | Proceedings of the Institution of Mechanical Engineers, Part B: Journal of Engineering Manufacture | 摘要: | In this paper, various contouring test systems for computer numerically controlled (CNC) machine tools are reviewed. It is the first time a laser diode and a quadrant sensor have been employed to build a simple contouring measuring system for testing dynamic performance of a CNC machine tool. The experimental work on a CNC machine tool with a Fanuc OM controller for various contouring paths under specified feed rates is carried out. Then, the compensation work is executed with the assistance of this developed contouring system. After the compensation, the contouring error, especially at a high feed rate and small radius, is reduced significantly. |
URI: | https://www.scopus.com/inward/record.uri?eid=2-s2.0-0036267428&doi=10.1243%2f0954405021520418&partnerID=40&md5=e8d869d1b07695b5caaef16ad4866afa https://scholars.lib.ntu.edu.tw/handle/123456789/612014 |
DOI: | 10.1243/0954405021520418 |
顯示於: | 機械工程學系 |
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