https://scholars.lib.ntu.edu.tw/handle/123456789/616429
標題: | Piezoreflectance study of an Fe-containing silicon carbon nitride crystalline film | 作者: | Hsieh C.H. Huang Y.S. Tiong K.K. Fan C.W. Chen Y.F. Chen L.C. Wu J.J. LI-CHYONG CHEN YANG-FANG CHEN |
公開日期: | 2000 | 卷: | 87 | 期: | 1 | 起(迄)頁: | 280-284 | 來源出版物: | Journal of Applied Physics | 摘要: | A detailed piezoreflectance (PzR) study of an Fe-containing silicon carbon nitride crystalline film in the temperature range between 15 and 580 K was performed. From the line shape fit of the PzR spectra, the impurity to band and the direct band-to-band transition energies which are denoted as Ei and Edg, respectively, at various temperatures were accurately determined. The parameters that describe the temperature dependence of Ei and Edg are evaluated and discussed. © 2000 American Institute of Physics. |
URI: | https://www.scopus.com/inward/record.uri?eid=2-s2.0-0000918038&doi=10.1063%2f1.371856&partnerID=40&md5=14714e66428cb1141895bbcf21777609 https://scholars.lib.ntu.edu.tw/handle/123456789/616429 |
ISSN: | 00218979 | DOI: | 10.1063/1.371856 |
顯示於: | 凝態科學研究中心 |
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