https://scholars.lib.ntu.edu.tw/handle/123456789/632261
標題: | Defect effect on electrical transport of multiwalled carbon nanotubes | 作者: | Hsiou Y.-F Chen C Chan C.-H Stobinski L YING-JAY YANG |
關鍵字: | Carbon nanotube; Coulomb blockade; Defect; Multiwalled carbon nanotube; Tunneling barriers | 公開日期: | 2005 | 卷: | 44 | 期: | 6A | 起(迄)頁: | 4245-4247 | 來源出版物: | Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers | 摘要: | The low-temperature transport properties of individual multiwalled carbon nanotubes are investigated at low temperatures using the multiple-probe technique. A low-ohmic contact between an electrode and a tube is prepared to prevent the influence of contact. Measurements using two- and four-probe techniques show Coulomb oscillations with nearly the same periods, indicating that the tunneling barriers are inside the tubes between each pair of electrodes. The experiment and the theoretical simulation suggest the existence of local barriers being responsible for the formation of a chain of weakly coupled islands and for the observed Coulomb blockade characteristics. © 2005 The Japan Society of Applied Physics. |
URI: | https://www.scopus.com/inward/record.uri?eid=2-s2.0-23944520802&doi=10.1143%2fJJAP.44.4245&partnerID=40&md5=f6e3c4bd1a59180fd150b3504c34ae63 https://scholars.lib.ntu.edu.tw/handle/123456789/632261 |
ISSN: | 214922 | DOI: | 10.1143/JJAP.44.4245 | SDG/關鍵字: | Computer simulation; Coulomb blockade; Defects; Electrodes; Electron tunneling; Transport properties; Low temperatures; Low-ohmic contact; Multiwalled carbon nanotubes; Tunneling n\barriers; Carbon nanotubes |
顯示於: | 電機工程學系 |
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