https://scholars.lib.ntu.edu.tw/handle/123456789/633075
標題: | Modeling the Effects of Surface Recombination Velocity in Scanning Photocurrent Microscopy for Ohmic-Contact Thin-Film Devices | 作者: | Wei, Yu Chien MING-HUA MAO |
公開日期: | 1-一月-2022 | 卷: | 2022-September | 來源出版物: | Proceedings of the International Conference on Numerical Simulation of Optoelectronic Devices, NUSOD | 摘要: | We studied numerically the carrier transport and confirmed the feasibility of our scanning photocurrent microscopy model in the minority carrier decay length extraction under different surface recombination velocities at the surfaces of ohmic-contact thin-film devices. |
URI: | https://scholars.lib.ntu.edu.tw/handle/123456789/633075 | ISBN: | 9781665478991 | ISSN: | 21583234 | DOI: | 10.1109/NUSOD54938.2022.9894801 |
顯示於: | 電機工程學系 |
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