https://scholars.lib.ntu.edu.tw/handle/123456789/640833
DC 欄位 | 值 | 語言 |
---|---|---|
dc.contributor.author | Wu, C. H. | en_US |
dc.contributor.author | Liu, J. | en_US |
dc.contributor.author | Zheng, X. T. | en_US |
dc.contributor.author | Tseng, Y. M. | en_US |
dc.contributor.author | Kobayashi, M. | en_US |
dc.contributor.author | VITA PI-HO HU | en_US |
dc.contributor.author | Su, C. J. | en_US |
dc.date.accessioned | 2024-03-13T06:48:04Z | - |
dc.date.available | 2024-03-13T06:48:04Z | - |
dc.date.issued | 2023-01-01 | - |
dc.identifier.isbn | 9798350327670 | - |
dc.identifier.issn | 01631918 | - |
dc.identifier.uri | https://scholars.lib.ntu.edu.tw/handle/123456789/640833 | - |
dc.description.abstract | This work systematically demonstrates a novel recovery scheme for MFIS-FeFET memory arrays involving device fabrication and circuit integration. For the first time, the timing to initiate recovery to prolong the endurance of FeFETs is studied. A 100-ns fast-unipolar pulsing (FUP) recovery treatment at optimized timing is demonstrated with significantly extending endurance cycles by a factor of 102, together with a nearly zero loss (0.02 %) in memory window (MW) per recovery period and a low MW fluctuation. An ultra-low recovery-induced time loss ratio of 5×10-5 % is achieved. Based on the developed scheme, we propose a self-tracking recovery circuit design utilizing current-mode memory sensing to monitor the degree of fatigue and automatically trigger the recovery operation. | en_US |
dc.relation.ispartof | Technical Digest - International Electron Devices Meeting, IEDM | en_US |
dc.title | Robust Recovery Scheme for MFIS-FeFETs at Optimal Timing with Prolonged Endurance: Fast-Unipolar Pulsing (100 ns), Nearly Zero Memory Window Loss (0.02 %), and Self-Tracking Circuit Design | en_US |
dc.type | conference paper | en_US |
dc.identifier.doi | 10.1109/IEDM45741.2023.10413819 | - |
dc.identifier.scopus | 2-s2.0-85185592063 | - |
dc.identifier.url | https://api.elsevier.com/content/abstract/scopus_id/85185592063 | - |
dc.relation.pageend | 4 | en_US |
item.openairetype | conference paper | - |
item.openairecristype | http://purl.org/coar/resource_type/c_5794 | - |
item.fulltext | no fulltext | - |
item.grantfulltext | none | - |
item.cerifentitytype | Publications | - |
crisitem.author.dept | Electrical Engineering | - |
crisitem.author.dept | Program in Semiconductor Device, Material, and Hetero-integration | - |
crisitem.author.orcid | 0000-0002-6216-214X | - |
crisitem.author.parentorg | College of Electrical Engineering and Computer Science | - |
crisitem.author.parentorg | Graduate School of Advanced Technology | - |
顯示於: | 電機工程學系 |
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