https://scholars.lib.ntu.edu.tw/handle/123456789/641733
標題: | Near-field Analysis of VCSELs after HTOL test | 作者: | Cheng, Hao Tien Zhang, Taixian Yang, Yun Cheng Liu, Te Hua CHAO-HSIN WU |
公開日期: | 1-一月-2022 | 來源出版物: | 2022 Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2022 - Proceedings | 摘要: | Investigation on the failure mechanisms of 850 nm vertical-cavity surface-emitting laser (VCSEL) chips in the high-temperature operating life (HTOL) stress tests are presented. Selected failed chips are put into further analysis to study their early failure mechanisms. |
URI: | https://scholars.lib.ntu.edu.tw/handle/123456789/641733 | ISBN: | 9798350350012 | DOI: | 10.1109/CLEO-PR62338.2022.10432261 |
顯示於: | 電機工程學系 |
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