公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
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2023 | Robust Recovery Scheme for MFIS-FeFETs at Optimal Timing with Prolonged Endurance: Fast-Unipolar Pulsing (100 ns), Nearly Zero Memory Window Loss (0.02 %), and Self-Tracking Circuit Design | Wu, C. H.; Liu, J.; Zheng, X. T.; Tseng, Y. M.; Kobayashi, M.; VITA PI-HO HU ; Su, C. J. | Technical Digest - International Electron Devices Meeting, IEDM |