公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
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2016 | X-ray absorption fine structure of ZnO thin film on Si and sapphire grown by MOCVD | Xin, J.; Chang, C.M.; Hsueh, C.-H.; Lee, J.-F.; Chen, J.-M.; Lin, H.-H.; Lu, N.; Ferguson, I.T.; Guan, Y.; Wan, L.; Yang, Q.; Feng, Z.C.; HAO-HSIUNG LIN | 2016 5th International Symposium on Next-Generation Electronics, ISNE 2016 |