公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
2003 | Integrated yield-mining solution with enhanced electrical test data correlation | Fan, Chih-Min; Guo, Ruey-Shan ; Chen, Argon ; Hon, Amos; Wei, John; King, Mingchu | The Ninth International Symposium on Semiconductor Manufacturing, 2003 | 0 | 0 | |
2018 | Intelligent Demand Aggregation and Forecasting | Chen, Argon ; Guo, Ruey-Shan ; Chang, Shi-Chung; Blue, Jakey; Chang, Felix; Chen, Ken; Hsia, Ziv; Hsie, B.W.; Lin, Peggy | | | | |
2003 | Intelligent Demand Aggregation and Forecasting | Chen, Argon ; Guo, Ruey-Shan ; Chang, Shi-Chung; Cheng, Janet; Ho, Odey; Fu, Legend; Huang, Tony; Yang, Kyle | | | | |
1996 | Intelligent IC Fabrication Diagnosis System | RUEY-SHAN GUO ; S. Chang,; J. Lee; C. Tsai; R. Gu | Second National Conference on Quality Management | | | |
1996 | Intelligent process diagnosis based on end-of-line electrical test data | Guo, Ruey-Shan ; Tsai, Cheng-Kai; Lee, Jian-Huei; Chang, Shi-Chung | Electronics Manufacturing Technology Symposium, 1996. | 8 | 0 | |
2005 | Inter-firm Collaboration Mechanism for Process-Product Innovation between Foundry and Fabless Design House | RUEY-SHAN GUO | Portland International Center for Management of Engineering and Technology Conference | 0 | 0 | |
2004 | Inter-firm Collaboration Mechanism in Process Development and Product Design between Foundry and Fabless Design House | RUEY-SHAN GUO ; S. Chang; Y. Su | Semiconductor Manufacturing Technology Workshop | 4 | | |
2007 | Inter-firm Engineering Processes and Business Models between Foundry and Fabless in Semiconductor Industry | RUEY-SHAN GUO ; F. Pai; S. Chiu; Y. Su | The 8th Asia-Pacific Conference on Industrial Engineering and Management Systems | | | |
2004 | Inter-firm Horizontal Collaboration Model for Total Solution Service Provision: Case Study on the Partnership of SIP Providers in the IC Design Industry | RUEY-SHAN GUO ; Y. Chang; Y. Su | Innovation & Management Conference | | | |
2004 | Manufacturing and Engineering Collaboration Mechanism between Foundry and Fabless | RUEY-SHAN GUO ; S. Chang; Y. Su | International Symposium on Semiconductor Manufacturing | | | |
1998 | Manufacturing Service Creation and Management for Next Generation Virtual Fab | RUEY-SHAN GUO ; Y. Lai; T. Chou; S. Chang; Y. Su | International Symposium on Semiconductor Manufacturing | | | |
1999 | Modeling and optimization of wafer-level spatial uniformity with the use of rational subgrouping | Guo, Ruey-Shan ; Chen, Argon; Liu, Cheewee; Lin, A.; ARGON CHEN | 1999 IEEE International Symposium on Semiconductor Manufacturing Conference | 2 | 0 | |
1993 | Modeling, Optimization and Control of Spatial Uniformity in Manufacturing Processes | RUEY-SHAN GUO ; E. Sachs | IEEE Transactions on Semiconductor Manufacturing | 33 | 26 | |
1999 | Modeling, Optimization and Control of Wafer-level Spatial Uniformity for Rapid Thermal Oxidation of Silicon Process | RUEY-SHAN GUO ; M. Lan; A. Lin; A. Chen | Automation Technology Conference | | | |
2007 | Monitoring and Control of Echelon Inventory in Semiconductor Manufacturing | RUEY-SHAN GUO ; D. Chiang | International Conference on Operations and Supply Chain Management | | | |
2006 | Monitoring Semiconductor Supply Chain based on Echelon WIP Inventory and CONWIP System | RUEY-SHAN GUO ; L. Yang; D. Chiang | The 7th Asia-Pacific Conference on Industrial Engineering and Management Systems | | | |
2009 | A multi-category inter-purchase time model based on hierarchical Bayesian theory | RUEY-SHAN GUO | Expert Systems with Applications | | | |
2007 | Multi-objectives exception management model for semiconductor back-end environment under turnkey service | Guo, Ruey-Shan ; Chiang, David M.; MING-HUANG CHIANG | Production Planning & Control | 8 | 9 | |
2004 | Multi-Plant Production Planning Coordination in a Multi-Echelon Supply Chain | MING-HUANG CHIANG ; Ji-Chyuan Liu; RUEY-SHAN GUO | Fifth Asia-Pacific Conference on Industrial Engineering and Management System | | | |
1999 | Network Ready Semiconductor Manufacturing Cluster Tool | RUEY-SHAN GUO ; A. Chen; C. Weng; S. Chang; P. Chang; C. Liu; C. Lu; S. Lee,; H. Huang; S. Lu | Automation Technology Conference | | | |