Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
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2012 | Scanning electron beam induced deposition for conductive tip modification. | Chen, P. L.; Su, James; Shiao, M. H.; Chang, M. N.; Lee, C. H.; CHIH-WEN LIU ; CHEE-WEE LIU | 7th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2012, Kyoto, Japan, March 5-8, 2012 | 6 | 0 |