Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
---|---|---|---|---|---|---|
2015 | PWL: A progressive wear leveling to minimize data migration overheads for NAND flash devices | Chen, F.-H.; Yang, M.-C.; Chang, Y.-H.; Kuo, T.-W.; TEI-WEI KUO | Design, Automation and Test in Europe |