Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
---|---|---|---|---|---|---|
1991 | Parallel Sequence Fault Simulation for Synchronous Sequential Circuits | Kung, C.; 林呈祥; Lin, Chen-Shang | VLSITSA, Taipei(1991.05) | |||
1994 | Reducing Hypertrophic Fault Events in Sequential Fault Simulation | Kung, C.; 林呈祥; Lin, Chen-Shang | VLSI Design/CAD Symposium, Taipei(1994.08) | |||
1992 | Test Reduction in Scan-Designed Circuits | Lai, W.; Kung, C.; 林呈祥; Lin, Chen-Shang | Proceedings of International Electronic Devices and Materials Symposium | |||
1993 | Test Time Reduction in Scan Designed Circuits | Lai, W.; Kung, C.; 林呈祥; Lin, Chen-Shang | EDAC-EUROASIC |