2013 | Automatic test pattern generation for delay defects using timed characteristic functions. | Ho, Shin-Yann; Lin, Shuo-Ren; Yuan, Ko-Lung; Kuo, Chien-Yen; Liao, Kuan-Yu; Jiang, Jie-Hong R.; CHIEN-MO LI ; JIE-HONG JIANG | The IEEE/ACM International Conference on Computer-Aided Design, ICCAD'13, San Jose, CA, USA, November 18-21, 2013 | 2 | 0 | |
2013 | Encoding multi-valued functions for symmetry. | Yuan, Ko-Lung; Kuo, Chien-Yen; Jiang, Jie-Hong R.; Li, Meng-Yen; JIE-HONG JIANG | The IEEE/ACM International Conference on Computer-Aided Design, ICCAD'13, San Jose, CA, USA, November 18-21, 2013 | | | |