Automatic test pattern generation for delay defects using timed characteristic functions.
Journal
The IEEE/ACM International Conference on Computer-Aided Design, ICCAD'13, San Jose, CA, USA, November 18-21, 2013
Pages
91-98
Date Issued
2013
Author(s)
Ho, Shin-Yann
Lin, Shuo-Ren
Yuan, Ko-Lung
Kuo, Chien-Yen
Liao, Kuan-Yu
Jiang, Jie-Hong R.
Type
conference paper