Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
---|---|---|---|---|---|---|
2000 | Testing for tunneling opens. | Li, Chien-Mo James; McCluskey, Edward J.; CHIEN-MO LI | Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000 | |||
2009 | 可撓式薄膜電晶體數位電路靜態時序分析 | 許肇軒; Hsu, Chao-Hsuan |