公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
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2023 | A Thru-Reflect-Series-Resistance (TRS) Calibration for Cryogenic Device Characterization in 40-nm CMOS Technology | Chen, Yi Ting; Huang, Ian; Lin, Min Jui; Chuang, Shu Yan; Ho, Hua Ling; Hsu, Kai Syang; Lin, Pin Yu; Chen, Sih Ying; LIANG-HUNG LU; SHIH-YUAN CHEN; JIUN-YUN LI ; JUN-CHAU CHIEN | IEEE MTT-S International Microwave Symposium Digest | 0 | 0 |