Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
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2020 | Learning to Automate the Design Updates from Observed Engineering Changes in the Chip Development Cycle | Kravets, V.N.; Jiang, J.-H.R.; Riener, H.; JIE-HONG JIANG | Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020 |