Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
---|---|---|---|---|---|---|
2022 | Online Rare Category Identification and Data Diversification for Edge Computing | Cui Y; Li Q; Xue C.J.; TEI-WEI KUO | IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems | 0 | 0 | |
2021 | Pattern-Guided file compression with user-Experience enhancement for log-Structured file system on mobile devices | Ji C; Chang L.-P; Pan R; Wu C; Gao C; Shi L; Kuo T.-W; Xue C.J.; TEI-WEI KUO | Proceedings of the 19th USENIX Conference on File and Storage Technologies, FAST 2021 | 11 | ||
2020 | Pruning Deep Reinforcement Learning for Dual User Experience and Storage Lifetime Improvement on Mobile Devices | Wu C; Cui Y; Ji C; Kuo T.-W; Xue C.J.; TEI-WEI KUO | IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems | 8 | 7 | |
2021 | Read-Ahead Efficiency on Mobile Devices: Observation, Characterization, and Optimization | Liang Y; Pan R; Du Y; Fu C; Shi L; Kuo T.-W; Xue C.J.; TEI-WEI KUO | IEEE Transactions on Computers | 3 | 4 | |
2022 | RM-SSD: In-Storage Computing for Large-Scale Recommendation Inference | Sun X; Wan H; Li Q; CHIA-LIN YANG ; TEI-WEI KUO ; Xue C.J. | Proceedings - International Symposium on High-Performance Computer Architecture | 9 | 0 | |
2020 | Shaving retries with sentinels for fast read over high-density 3d flash | Li Q; Ye M; Cui Y; Shi L; Li X; Xue C.J.; TEI-WEI KUO | Proceedings of the Annual International Symposium on Microarchitecture, MICRO | 16 | 0 | |
2022 | Stop unnecessary refreshing: extending 3D NAND flash lifetime with ORBER | Ye M; Li Q; Gao C; Deng S; TEI-WEI KUO ; Xue C.J. | CCF Transactions on High Performance Computing | 1 | 1 | |
2022 | TRACE: A Fast Transformer-based General-Purpose Lossless Compressor | Mao Y; Cui Y; TEI-WEI KUO ; Xue C.J. | WWW 2022 - Proceedings of the ACM Web Conference 2022 | 1 | 0 | |
2020 | Valid Window: A New Metric to Measure the Reliability of NAND Flash Memory | Ye M; Li Q; Nie J; Kuo T.-W; Xue C.J.; TEI-WEI KUO | Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020 | 0 | 0 |