2004 | Face authentication test on the BANCA database | Messer, K.; Kittler, J.; Sadeghi, M.; Hamouz, M.; Kostin, A.; Cardinaux, F.; Marcel, S.; Bengio, S.; Sanderson, C.; Poh, N.; Rodriguez, Y.; Czyz, J.; Vandendorpe, L.; McCool, C.; Lowther, S.; Sridharan, S.; Chandran, V.; Palacios, R.P.; Vidal, E.; Bai, L.; Shen, L.; Wang, Y.; Yueh-Hsuan, C.; Hsien-Chang, L.; Yi-Ping, H.; Heinrichs, A.; M?ller, M.; Tewes, A.; Von Der Malsburg, C.; W?rtz, R.; Wang, Z.; Xue, F.; Ma, Y.; Yang, Q.; Fang, C.; Ding, X.; Lucey, S.; Goss, R.; Schneiderman, H.; YI-PING HUNG | Proceedings - International Conference on Pattern Recognition | | | |
2018 | Synchrotron radiation X-Ray absorption spectroscopy and spectroscopic ellipsometry studies of insb thin films on GaAs grown by metalorganic chemical vapor deposition | Qian, Y.; Liang, Y.; Luo, X.; He, K.; Sun, W.; Talwar, D.N.; Chan, T.-S.; Ferguson, I.; Wan, L.; Yang, Q.; Feng, Z.C.; HAO-HSIUNG LIN | Advances in Materials Science and Engineering | 5 | 6 | |
2016 | X-ray absorption fine structure of ZnO thin film on Si and sapphire grown by MOCVD | Xin, J.; Chang, C.M.; Hsueh, C.-H.; Lee, J.-F.; Chen, J.-M.; Lin, H.-H.; Lu, N.; Ferguson, I.T.; Guan, Y.; Wan, L.; Yang, Q.; Feng, Z.C.; HAO-HSIUNG LIN | 2016 5th International Symposium on Next-Generation Electronics, ISNE 2016 | | | |