Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
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2013 | Microscopy ambient ionization top-down mass spectrometry reveals developmental patterning | CHENG-CHIH HSU ; White, N.M.; Hayashi, M.; Lin, E.C.; Poon, T.; Banerjee, I.; Chen, J.; Pfaff, S.L.; Macagno, E.R.; Dorrestein, P.C. | National Academy of Sciences of the United States of America | 27 | 28 |