Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
---|---|---|---|---|---|---|
2020 | Functional-Like Transition Delay Fault Test-Pattern Generation using a Bayesian-Based Circuit Model | Chen, C.-Y.; Cheng, C.-H.; JIUN-LANG HUANG ; Chakrabarty, K. | Proceedings of the European Test Workshop | 3 | 0 |