Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
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2022 | Low-IR-Drop Test Pattern Regeneration Using A Fast Predictor | Liu, Shi Tang; Chen, Jia Xian; Wu, Yu Tsung; Hsieh, Chao Ho; CHIEN-MO LI ; Chang, Norman; Li, Ying Shiun; Chuang, Wen Tze | Proceedings - International Symposium on Quality Electronic Design, ISQED | 0 | 0 |