Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
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2015 | A Test-Application-Count Based Learning Technique for Test Time Reduction | G.-Y. Lin; K.-H. Tsai; J.-L. Huang; W.-T. Cheng; JIUN-LANG HUANG | International Symposium on VLSI Design, Automation, and Test |