Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
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2001 | Interface reactions of high-k Y2O3 gate oxides with Si | Busch, BW; Kwo, J; MINGHWEI HONG ; Mannaerts, JP; Sapjeta, BJ; Schulte, WH; Garfunkel, E; Gustafsson, T | Applied Physics Letters |