公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
---|---|---|---|---|---|---|
2020 | Learning to Automate the Design Updates from Observed Engineering Changes in the Chip Development Cycle | Kravets, V.N.; Jiang, J.-H.R.; Riener, H.; JIE-HONG JIANG | Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020 |