公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
---|---|---|---|---|---|---|
2004 | Electron spin resonance study of the effect of applied stress during thermal oxidation of (111)Si on inherent Pb interface defects | Pierreux, D.; Stesmans, A.; Jaccodine, R. J.; Lin, M. T.; Delph, T. J.; MINN-TSONG LIN | Microelectronic Engineering | 4 | 4 | |
2003 | Influence of in situ applied stress during thermal oxidation of (111)Si on P-b interface defects | Stesmans, A.; Pierreux, D.; Jaccodine, R. J.; Lin, M. T.; Delph, T. J.; MINN-TSONG LIN | Applied Physics Letters | 41 | 35 |