公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
2012 | Influence of surface roughness and interfacial layer on the infrared spectra of V-CVD grown 3C-SiC/Si (100) epilayers | CHEE-WEE LIU ; Talwar, D.N.; Feng, Z.C.; Liu, C.W.; Tin, C.-C.; CHEE-WEE LIU | Semiconductor Science and Technology | | | |
2015 | Investigation of optical parameters of boron doped aluminium nitride films grown on diamond using spectroscopic ellipsometry | CHEE-WEE LIU ; Xie, D.; Qiu, Z.R.; Talwar, D.N.; Liu, Y.; Song, J.-H.; Huang, J.-L.; Mei, T.; Liu, C.W.; Feng, Z.C.; CHEE-WEE LIU | International Journal of Nanotechnology | | | |
1993 | On the impurity-induced phonon disordering in novel Cd1-xZnxTe alloys | Talwar, D.N.; Feng, Z.C.; Becla, P. | Phys. Rev. B | | | |
2018 | Optical and structural characteristics of Bridgman grown cubic Zn<inf>1-x</inf>Mn<inf>x</inf>Te alloys | Talwar, D.N.; Becla, P.; Lin, H.-H.; Feng, Z.C.; HAO-HSIUNG LIN | Materials Chemistry and Physics | | | |
2014 | Optical properties of plasma-assisted molecular beam epitaxy grown InN/sapphire | Talwar, D.N.; Liao, Y.C.; Chen, L.C. ; Chen, K.H.; Feng, Z.C. | Optical Materials | 6 | 6 | |
2018 | Spectroscopic phonon and extended x-ray absorption fine structure measurements on 3C-SiC/Si (001) epifilms | Talwar, D.N.; Wan, L.; Tin, C.-C.; Feng, Z.C.; HAO-HSIUNG LIN | Applied Surface Science | 6 | 5 | |
2019 | Surface/structural characteristics and band alignments of thin Ga <inf>2</inf> O <inf>3</inf> films grown on sapphire by pulse laser deposition | Yang, H.; Qian, Y.; Zhang, C.; Wuu, D.-S.; Talwar, D.N.; Lin, H.-H.; Lee, J.-F.; Wan, L.; He, K.; Feng, Z.C.; HAO-HSIUNG LIN | Applied Surface Science | | | |
2018 | Synchrotron radiation X-Ray absorption spectroscopy and spectroscopic ellipsometry studies of insb thin films on GaAs grown by metalorganic chemical vapor deposition | Qian, Y.; Liang, Y.; Luo, X.; He, K.; Sun, W.; Talwar, D.N.; Chan, T.-S.; Ferguson, I.; Wan, L.; Yang, Q.; Feng, Z.C.; HAO-HSIUNG LIN | Advances in Materials Science and Engineering | 5 | 6 | |