公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
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2022 | Synchrotron X-ray study of electromigration, whisker growth, and residual strain evolution in a Sn Blech structure | Lee P.-T; Hsieh W.-Z; Lee C.-Y; Tseng S.-C; Tang M.-T; Chiang C.-Y; C. ROBERT KAO ; Ho C.-E. | Scripta Materialia | 2 | 2 |