https://scholars.lib.ntu.edu.tw/handle/123456789/625545
標題: | Synchrotron X-ray study of electromigration, whisker growth, and residual strain evolution in a Sn Blech structure | 作者: | Lee P.-T Hsieh W.-Z Lee C.-Y Tseng S.-C Tang M.-T Chiang C.-Y C. ROBERT KAO Ho C.-E. |
關鍵字: | Electromigration; Laue diffraction; Nano X-ray fluorescence; Sn whiskers; Synchrotron radiation | 公開日期: | 2022 | 卷: | 214 | 來源出版物: | Scripta Materialia | 摘要: | Synchrotron X-ray analysis of the Sn electromigration behavior and Sn whisker growth in a Blech structure using nano-X-ray fluorescence microscopy and white beam Laue nanodiffraction was conducted. Sn depletion at the cathode and whisker/extrusion formation at the anode were characterized in-situ, and the results obeyed the electromigration kinetics. This electromigration scenario gradually decayed because of the counterbalance between electron wind force and back stress. White beam Laue nanodiffraction analysis showed that a noticeable compressive deviatoric stress in the direction of electron flow built up at the anode of Sn strips, particularly in the roots of Sn whiskers, confirming that electromigration-induced atomic accumulation occurred downstream in a strip and that Sn whiskering was closely related to internal stress resulting from atomic accumulation in confined segments. Finally, a theoretical model based on fundamental electromigration theory revealed that Sn diffused predominately through lattice and grain boundary paths at Sn homologous temperature of 0.6. © 2022 Acta Materialia Inc. |
URI: | https://www.scopus.com/inward/record.uri?eid=2-s2.0-85126919378&doi=10.1016%2fj.scriptamat.2022.114682&partnerID=40&md5=444740af614f49db601f9ac3e0654d11 https://scholars.lib.ntu.edu.tw/handle/123456789/625545 |
ISSN: | 13596462 | DOI: | 10.1016/j.scriptamat.2022.114682 | SDG/關鍵字: | Anodes; Electromigration; Fluorescence; Fluorescence microscopy; Grain boundaries; Lattice theory; Synchrotrons; X ray powder diffraction; Growth strain; Laue diffraction; Nano X-ray fluorescence; Nanodiffraction; Residual strain evolution; Sn whisker; Whisker growth; White beams; X ray fluorescence; X-ray studies; Synchrotron radiation |
顯示於: | 材料科學與工程學系 |
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