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Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link | |
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1 | 2021 | Modeling dislocation-related reverse bias leakage in GaN p-n diodes | Qwah K.S; Robertson C.A; Wu Y.-R; Speck J.S.; YUH-RENN WU | Semiconductor Science and Technology | 3 | 2 |