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Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link | |
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1 | 2020 | Disorder effects in nitride semiconductors: Impact on fundamental and device properties | Weisbuch C; Nakamura S; Wu Y.-R; Speck J.S.; YUH-RENN WU | Nanophotonics | 20 | 18 | |
2 | 2020 | The 2020 UV emitter roadmap | Amano, H.; Collazo, R.; De Santi, C.; Einfeldt, S.; Funato, M.; Glaab, J.; Hagedorn, S.; Hirano, A.; Hirayama, H.; Ishii, R.; Kashima, Y.; Kawakami, Y.; Kirste, R.; Kneissl, M.; Martin, R.; Mehnke, F.; Meneghini, M.; Ougazzaden, A.; Parbrook, P.J.; Rajan, S.; Reddy, P.; R?mer, F.; Ruschel, J.; Sarkar, B.; Scholz, F.; Schowalter, L.J.; Shields, P.; Sitar, Z.; Sulmoni, L.; Wang, T.; Wernicke, T.; Weyers, M.; Witzigmann, B.; Wu, Y.-R.; Wunderer, T.; Zhang, Y.; YUH-RENN WU | Journal of Physics D: Applied Physics | 267 | 239 |