第 1 到 6 筆結果,共 6 筆。
公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 | |
---|---|---|---|---|---|---|---|
1 | 2014 | Flexible TFT Circuit Analyzer Considering Process Variation, Aging, and Bending Effects | E. H. Ma; W. E. Wei; H. Y. Li; J. C. M. Li; I. C. Cheng; Y. H. Yeh; I-CHUN CHENG ; CHIEN-MO LI | IEEE Journal of Display Technology | 3 | 3 | |
2 | 2014 | A Flexible TFT Circuit Yield Optimizer Considering Process Variation, Aging, and Bending Effects | Wen-En Wei; Hung-Yi Li; Cheng-Yu Han; James Chien-Mo Li; Jian-Jang Huang; I-Chun Cheng; Chien-Nan Liu; Yung-Hui Yeh; I-CHUN CHENG ; JIAN-JANG HUANG ; CHIEN-MO LI | Journal of Display Technology | 5 | 2 | |
3 | 2011 | Placement optimization of flexible TFT digital circuits | Liu, C.; Ma, E.-H.; Wei, W.-E.; Li, J.; Cheng, I.-C.; Yeh, Y.-H.; I-CHUN CHENG ; CHIEN-MO LI | IEEE Design and Test of Computers | 4 | 4 | |
4 | 2010 | Reliability screening of a-Si TFT circuits: Very-low voltage and I <inf>DDQ</inf> Testing | Shen, S.-T.; Liu, C.; Ma, E.-H.; Cheng, I.-C.; Li, J.C.-M.; I-CHUN CHENG ; CHIEN-MO LI | IEEE/OSA Journal of Display Technology | 2 | 1 | |
5 | 2009 | Very-Low-Voltage Testing of Amorphous Silicon TFT Circuits | Shiue-Tsung Shen,; Wei-Hsiao Liu,; En-Hua Ma,; J. C.-M. Li,; I-Chun Cheng,; I-CHUN CHENG ; CHIEN-MO LI | IEEE Asian Test Symposium | 0 | 0 | |
6 | 2009 | Very-Low-Voltage Testing of Amorphous Silicon TFT Circuits. | Shen, Shiue-Tsung; Liu, Wei-Hsiao; Ma, En-Hua; Li, James Chien-Mo; I-CHUN CHENG ; CHIEN-MO LI | Proceedings of the Eighteentgh Asian Test Symposium, ATS 2009, 23-26 November 2009, Taichung, Taiwan | 1 | 0 |