考慮次10奈米製程晶片複雜度與變異性的平行化測試圖樣產生與適性測試技術之開發(I)

Project title

考慮次10奈米製程晶片複雜度與變異性的平行化測試圖樣產生與適性測試技術之開發(I)

Internal ID

103-2221-E-002-275-

Principal Investigator

JIUN-LANG HUANG

Start Date

August 1, 2014

End Date

July 31, 2015

Partner Organizations

National Science and Technology Council