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.National Taiwan University / 國立臺灣大學
Project / 研究計畫
考慮次10奈米製程晶片複雜度與變異性的平行化測試圖樣產生與適性測試技術之開發(I)
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考慮次10奈米製程晶片複雜度與變異性的平行化測試圖樣產生與適性測試技術之開發(I)
Details
Primary Data
Project title
考慮次10奈米製程晶片複雜度與變異性的平行化測試圖樣產生與適性測試技術之開發(I)
Internal ID
103-2221-E-002-275-
Principal Investigator
JIUN-LANG HUANG
Start Date
August 1, 2014
End Date
July 31, 2015
Partner Organizations
National Science and Technology Council
