A Test-Application-Count Based Learning Technique for Test Time Reduction

Journal

International Symposium on VLSI Design, Automation, and Test

Date Issued

2015-01

Author(s)

G.-Y. Lin

K.-H. Tsai

J.-L. Huang

W.-T. Cheng

JIUN-LANG HUANG

DOI

10.1109/VLSI-DAT.2015.7114507

URI

http://scholars.lib.ntu.edu.tw/handle/123456789/394735

Type

conference paper