Effects of gate-bias stress on ZnO thin-film transistors

Journal

Journal of the Society for Information Display

Journal Volume

18

Pages

802-806

Date Issued

2010-01

Author(s)

L.-Y. Su

H.-Y. Lin

S.-L. Wang

Y.-H. Yeh

C.-C. Cheng

L.-H. Peng

J.-J. Huang

JIAN-JANG HUANG

DOI

10.1889/JSID18.10.802

URI

http://scholars.lib.ntu.edu.tw/handle/123456789/359466

Type

journal article