Column Parity and Row Select (CPRS): BIST Diagnosis for Errors in Multiple Scan Chains

Resource

Test Conference, 2005. Proceedings. ITC 2005. IEEE International

Journal

International Test Conference

Date Issued

2005-10

Author(s)

H.M. Lin

DOI

URI

Type

conference paper

File(s)

Name

01584078.pdf

Size

199.12 KB

Format

Adobe PDF

Checksum

(MD5):aa8ae2ab55be8413c9bc249efc2b3578