Column Parity and Row Select (CPRS): BIST Diagnosis for Errors in Multiple Scan Chains
Resource
Test Conference, 2005. Proceedings. ITC 2005. IEEE International
Journal
International Test Conference
Date Issued
2005-10
Author(s)
Abstract
A BIST diagnosis technique is presented to diagnose multiple errors in multiple scan chains. An LFSR randomly selects outputs of multiple scan chains every scan cycle. The column parity and row parity of the selected scan outputs are observed every scan cycle and every scan unload, respectively. Compared with other techniques, which diagnose no more than 15% errors, CPRS correctly diagnoses all errors in the presence of 1% unknowns. The cost of this technique is area overhead and one additional output observed every scan cycle.
Type
conference paper
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