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College of Electrical Engineering and Computer Science / 電機資訊學院
Electronics Engineering / 電子工程學研究所
A routability constrained scan chain ordering technique for test power reduction
Details
A routability constrained scan chain ordering technique for test power reduction
Journal
Asia and South Pacific Design Automation Conference
Pages
648--652
Date Issued
2006-01
Author(s)
X.-L. Huang
J.-L. Huang
JIUN-LANG HUANG
URI
http://scholars.lib.ntu.edu.tw/handle/123456789/325751
Type
conference paper
