Advanced HEMT characteristics of epitaxial quality-improved GaN by using patterned sapphire
Journal
ECS Transactions
Journal Volume
89
Journal Issue
5
Pages
35-38
Date Issued
2019
Author(s)
Chien, C.Y.
Huang, C.C.
Yi, C.K.
Yen, C.W.
CHIEH-HSIUNG KUAN
SDGs
Type
conference paper