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Publication:
Edge field enhanced deep depletion phenomenon in MOS structures with ultra-thin gate oxides
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Date
2010
Authors
Cheng, J.-Y.
Cheng, J.-Y.;Lu, H.-T.;Yang, C.-Y.;Hwu, J.-G.
Lu, H.-T.
Yang, C.-Y.
Hwu, J.-G.
JENN-GWO HWU
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Research Projects
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http://www.scopus.com/inward/record.url?eid=2-s2.0-78751524776&partnerID=MN8TOARS
http://scholars.lib.ntu.edu.tw/handle/123456789/356362
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Electrical Engineering / 電機工程學系
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