Diagnosis of Resistive and Stuck-open Defects in Digital CMOS IC
Journal
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Journal Volume
24
Journal Issue
11
Pages
1748-1759
Date Issued
2005-11
Author(s)
Abstract
A resistive-open defect is an imperfect circuit connection that can be modeled as a defect resistor between two circuit nodes that should be connected. A stuck-open (SOP) defect is a complete break (no current flow) between two circuit nodes that should be connected. Conventional single stuck-at fault diagnosis cannot precisely diagnose these two defects because the test results of defective chips depend on the sequence of test patterns. This paper presents precise diagnosis techniques for these two defects. The diagnosis techniques take the test-pattern sequence into account, and therefore, produce precise diagnosis results. Also, our diagnosis technique handles multiple faults of different fault models. The diagnosis techniques are validated by experimental results. Twelve SOP and one resistive-open chips are diagnosed out of a total of 459 defective chips. © 2005 IEEE.
Type
journal article