A Configurable Integrated Test Methodology for Monolithic Microwave Integrated Circuit Production
Journal
IEEE Transactions on Semiconductor Manufacturing
Journal Volume
5
Journal Issue
3
Pages
248-254
Date Issued
1992
Author(s)
Abstract
A configurable integrated test (CIT) model has been developed for GaAs monolithic microwave integrated circuit (MMIC) production control. The optimal process/test strategy for an MMIC in production phase can easily be predicted from this model. The adaptive nature of the CIT model also suggests suitability of the screen criteria and quantifies the necessity of each test step. Application of this CIT method to MMIC manufacturing will result in significant cost reductions. The CIT theory and application examples are presented in this paper. © 1992 IEEE
Type
journal article