A Configurable Integrated Test Methodology for Monolithic Microwave Integrated Circuit Production

Journal

IEEE Transactions on Semiconductor Manufacturing

Journal Volume

5

Journal Issue

3

Pages

248-254

Date Issued

1992

Author(s)

Wang, H.

Yang, D.C.

Esfandiari, R.

Joseph, T.

Ellis, R.K.

Ng, G.

DOI

10.1109/66.149816

URI

https://scholars.lib.ntu.edu.tw/handle/123456789/497377

URL

https://www.scopus.com/inward/record.uri?eid=2-s2.0-0026903457&doi=10.1109%2f66.149816&partnerID=40&md5=4d574de30a8135ce41f09cba88995d90

Type

journal article